Characterization of chiral metamaterial sensor with high sensitivity

Abstract

In this study, a chiral metamaterial sensor applications are created by placing asymmetrically two meander line front and back side of the substrate layer. Characterization of the dielectric constant, thickness and loss tangent have been performed both in simulation and experimental methods. Different Arlon type materials used for showing the effects of dielectric constant on transmission coefficient. Obtained bandwidths for characterization are greater than the similar studies which verifyies increased sensitivity. This study also differs from similar studies by presenting permeability and loss tangent effects on transmission coefficient as well as having wider bandwidth that increase sensitivity due to its special chiral design. Set of experimental study performed to verify simulated ones for change in thickness, dielectric constant and loss tangent and compatible results with simulated ones obtained. According to simulation and experimental study results, proposed structurecan be used myriad microwave sensing applications effectively due to high sensitivity property.