Determination of natural line widths of Kα X-ray lines for some elements in the atomic range 50≤Z≤65 at 59.5 keV

Abstract

The semi-empirical determination of natural widths of K alpha X-ray lines (K alpha 1 and K alpha 2) were performed for Si), Sb, Te, I, Ba, La, Ce, Pr, Nd, Sm, Eu, Gd and Tb. For the semi-empirical determination of the line widths, K shell fluorescence yields of elements were measured. The samples were excited by 59.5 keV gamma rays from a (241)A m annular radioactive source in order to measure the K shell fluorescence yields. The emitted K X-rays from the samples were counted by an Ultra-LEGe detector with a resolution of 150 eV at 5.9 keV. The measured K shell fluorescence yields were used for the calculation of K shell level widths. Finally, the natural widths of K X-ray lines were determined as the sums of levels which involved in the transition. The obtained values were compared with earlier studies.